There was damage in the use of EFR32MG21A020F768IM32-B, and two pieces of damage occurred. One piece of damage was completely short-circuited inside VCC and GND, and the other piece was short-circuited by part of IO port. This is a problem that occurs during use. We are using JLINK - -3.3V power supply debugging, which is the problem during the debugging process! Can experts make an X-ray on the damaged chip and see what is going on inside?
It is possible damaged by EOS or ESD. Please contact your local FAE or sales man for further RMA analyse.